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AUTOMATED VISUAL INSPECTION AND MACHINE VISION III
- Item #:
- 050774
- UPC:
Details
-
Title:
Automated Visual Inspection and Machine Vision III
-
Subtitle:
At SPIE Optical Metrology
-
Date/Location:
Held 27 June 2019, Munich, Germany.
-
Series:
Proceedings of SPIE Volume 11061
-
Editor:
Beyerer, Jurgen
-
ISBN:
9781510628014
-
Pages:
164 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Oct 2019 )
-
Title:
Automated Visual Inspection and Machine Vision III
-
Subtitle:
At SPIE Optical Metrology
-
Date/Location:
Held 27 June 2019, Munich, Germany.
-
Series:
Proceedings of SPIE Volume 11061
-
Editor:
Beyerer, Jurgen
-
ISBN:
9781510628014
-
Pages:
164 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Oct 2019 )