STEEP DISPERSION ENGINEERING AND OPTO-ATOMIC PRECISION METROLOGY XI

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046730

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Title: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
Subtitle: At SPIE OPTO
Date/Location: Held 29 January - 1 February 2018, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 10548
Editor: Shahriar, Selim M.
ISBN: 9781510615816
Pages: 140 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jul 2018 )

Title: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
Subtitle: At SPIE OPTO
Date/Location: Held 29 January - 1 February 2018, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 10548
Editor: Shahriar, Selim M.
ISBN: 9781510615816
Pages: 140 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jul 2018 )