AUTOMATED VISUAL INSPECTION AND MACHINE VISION II

AUTOMATED VISUAL INSPECTION AND MACHINE VISION II

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046517
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Details

  • Title: Automated Visual Inspection and Machine Vision II
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 29 June 2017, Munich, Germany.
  • Series: Proceedings of SPIE Volume 10334
  • Editor: Beyerer, Jurgen
  • ISBN: 9781510611139
  • Pages: 256 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2017 )

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  • Title: Automated Visual Inspection and Machine Vision II
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 29 June 2017, Munich, Germany.
  • Series: Proceedings of SPIE Volume 10334
  • Editor: Beyerer, Jurgen
  • ISBN: 9781510611139
  • Pages: 256 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Sep 2017 )