OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IV

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IV

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046274
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Details

  • Title: Optical Metrology and Inspection for Industrial Applications IV
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 12-14 October 2016, Beijing, China.
  • Series: Proceedings of SPIE Volume 10023
  • Editor: Han, Sen
  • ISBN: 9781510604650
  • Pages: 456 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2017 )

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  • Title: Optical Metrology and Inspection for Industrial Applications IV
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 12-14 October 2016, Beijing, China.
  • Series: Proceedings of SPIE Volume 10023
  • Editor: Han, Sen
  • ISBN: 9781510604650
  • Pages: 456 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2017 )