Details
- Title: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7
- Subtitle: 212th ECS Meeting
- Date/Location: Held 7-12 October 2007, Washington, DC, USA.
- Series: ECS Transactions Volume 11 No.03
- Editor: Schroder, D. K. et al.
- ISBN: 9781713819622
- Pages: 394 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Electrochemical Society (ECS)
- POD Publisher: Curran Associates, Inc. ( Nov 2020 )
Description
Members/Attendees
Tab 4
- Title: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7
- Subtitle: 212th ECS Meeting
- Date/Location: Held 7-12 October 2007, Washington, DC, USA.
- Series: ECS Transactions Volume 11 No.03
- Editor: Schroder, D. K. et al.
- ISBN: 9781713819622
- Pages: 394 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Electrochemical Society (ECS)
- POD Publisher: Curran Associates, Inc. ( Nov 2020 )