Details
- Title: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM 2017)
- Date/Location: Held 24-26 May 2017, Saint Petersburg, Russia.
- IEEE #: CFP17C43-POD
- ISBN: 9781538618110
- Pages: 895 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2017 )
Description
Members/Attendees
Tab 4
- Title: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM 2017)
- Date/Location: Held 24-26 May 2017, Saint Petersburg, Russia.
- IEEE #: CFP17C43-POD
- ISBN: 9781538618110
- Pages: 895 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Aug 2017 )